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SimonZeidler - 16:39, Tuesday 01 September 2015 (168)Get code to link to this report
SiC measured with JASMINE scatterometer

I present here the results of my own measurements on the polished SiC sample from Kyocera.
The measurements were done after Iwata-san did his measurements and after I did a necessary readjustment of the hight and the orientation of the laser.

The data show now a relatively equal maximum due to specular reflection, limited, of course, by the angular resolution of the system (-> 1 deg).
I added some roughly read data from Iwata-sans Backscattering measurements.
It is interesting to note that they are for all angles bigger than the JASMINE data would imply. At least for the maximum at AOI=0, it might be a true value. However, I am skeptical that the other values (all at around 0.02) are due to pure backscattering. Actually, I guess that noise is the main factor for their values...

The next step will be the measurement of the non-polished side of SiC.

Images attached to this report
168_20150901093907_sic.jpg
Comments related to this report
TomotadaAkutsu - 12:04, Thursday 03 September 2015 (170)

It would be nice if you check the polarization of the incident lights; maybe it would be different between the JASMINE one and the backscattering measurement system.